Yahya I. Alivov1 (

),
B. M. Ataev
2,
M. V. Chukichev
3,
V. V. Mamedov
2,
V.I. Zinenko
1, Yu. A. Agafonov
1,
A. N. Pustovit
1
1 Institute of Microelectronics Technology, Russian Academy of Sciences, Chernogolovka,142432 Moscow district, Russia.
2 Institute of Physics, Daghestan Scientific Centre of the Russian Academy of Sciences, M.Yaragy, 94, 367003 Makhachkala, Russia.
3Department of Physics, Moscow State University, Vorob'evy gory, Moscow, Russia.
Considerable efforts are made today to reproducibly grow low-resistive ZnO
films since this semiconductor is a very promising material for blue and
ultraviolet light-emitting devices fabrication. Like many other wide-band-gap
semiconductors, undoped ZnO has naturally n-type conduction, and it is
difficult to invert its conduction type. Recently, a co-doping technique [1]
were proposed to produce low-resistive p-type ZnO by simultaneous
incorporation of group III (Ga, Al, In) and N elements. According to this
technique group III metal and N elements are doped at the same time and
creating N acceptor centers are stabilized by the formation of N-III-N (III =
Ga, Al, In) type complexes. It was reported in [2] on preparation of p-type
ZnO films by this way by pulsed laser deposition from Ga-doped ZnO target in
N2 atmosphere.
In our study, the ZnO:Ga films were implanted by N+ ions with 180 keV energy
at various nitrogen concentrations. ZnO:Ga films were grown by chemical vapor
deposition method. The Ga concentration determined by a secondary ion mass
spectroscopy (SIMS) was 3*1018 cm-3.
Implanted nitrogen concentrations in
samples were approximately 5*1017, 6.5*1018, and
1*1019 cm-3. As a reference
sample, Ga-undoped ZnO film were also N+-implanted with the same
concentration. After implantation, the samples were high-temperature annealed
in air at 950 oC for 2 hours to remove the formed radiation Frenkel-pair
defects.
Four point van der Pauw and cathodoluminescense methods were used to measure
the electrical and optical properties of the samples. ZnO:(Ga, N) samples with
N concentrations 6.5*1018, and 1*1019 cm-3,
where there were sufficient number
of N atoms to form N-Ga-N bonds, were found to be of p-type conduction with
acceptor density 5*1016, and 3*1017 cm-3;
respectively. No conduction type
inversion was observed in non-Ga-doped ZnO films. These results indicate that
co-doping of ZnO with Ga and N is more effective than ZnO doping only with N.
Besides, our studies show that the conduction type inversion can be also
achieved by the N+ implantation of previously Ga-doped ZnO films. Although the
acceptor density in the films is apparently low for many electronic
applications, the proper optimization of growth parameters can sufficiently
improve the electrical properties of p-ZnO films.
1.T.Yamamoto et al, Jpn.J.Appl.Phys. 38, L166 (1999)
2. M.Joseph et al, Jpn.J.Appl.Phys. 38, L1205 (1999)