Optical and structural properties
of films and multilayer thin film structures
with nanometer-sized LiF, CaF2 crystals
O. V. Goncharova,
Vladimir S. Kalinov (

),
A. P. Voitovich
Institute of Molecular and Atomic Physics, National Academy of Sciences of
Belarus, F. Scaryna Prospect 70, 220072 Minsk, Belarus.
Artificial dielectrics are the man-made nano-structured composite materials
which can be engineered to possess unique properties in reflectivity,
emissivity and optical non-linearity. These synthetic dielectrics as well as
semiconductor composites will also have significant applications in
programmable optoelectronic and nonlinear optical devices. Additionally, the
structure of micro-polarizing beam splitters possesses a broad reflectance
band for the TE polarization in a wide angular range.
Extra to the technological engineering of nano-structured thin film materials
with predictable optical properties non-destructive irradiation can be used in
a variety of ways to fabricate novel materials and integrated devices, as
illustrated in the report.
We report the design and fabrication of the multilayer thin film preformed
materials for integrated emitters and the subsequent colouring and optical
characterization of luminescence spectra of the resulting artificial
dielectric structures. The preformed nonepitaxial periodic thin-film systems
were prepared as irradiation sensitive materials and were used for the
fabrication of integrated emitting elements with broad aperture-tunable
spectra in the region 450-700nm. The emitting defects space ordering as well
as optically active centers selection and emitting efficiency in such elements
were directly controlled by the technologically controllable space ordering of
the nanometer-sized crystals in preformed thin-film structures and by the
post-growth gamma-irradiation with various exposure doses.
The modification of the emission spectra in the NC-composed film structures
with respect to one for single-crystal samples is determined by
room-temperature comparative investigations of the photoluminescence
parameters of the samples of high-pure LiF, CaF2 crystals, films and periodic
thin films structures with nanometer-sized LiF, CaF2 crystals after
gamma-irradiation at the same exposure conditions.